Mes compétences :
Data fit (global optimization methodology)
E-beam lithography
Numerical modeling (physical phenomena)
Optical metrology (nondestructive testing)
EUV Interferometric lithography
Numerical modeling
Data analysis
Scatterometry
Data preparation for electron beam lithography
Data Mining
Nondestructive testing (Optical metrology: Scatter
Design of instruments for microelectronics applica
Sensitivity analysis
Design of a high performance data fit technic base
Data analysis (PCA, Sensitivity analysis, Metamode
Nondestructive Testing
modeling of Physical phenomena
Big data analysis with data mining (principle comp
non linear optics
Unix, Windows
LabVIEW
Python, Java, Groovy, Matlab, Mathcad, Maple
Intellectual Property Law
PSpice, Labview
Experimental data analysis
Data processing
Big data analysis
Interferometers
Data preparation
principle component analysis
UNIX
Python Programming
PSPICE
Microsoft Windows
Microelectronics
Matlab
MathCAD
Maple
Java
Groovy