Paris
Patrice Salzenstein holds a PhD in Electronics from the University of Sciences and Technologies of Lille (USTL, 1996), a Master of Research degree (USTL, 1993), and an engineering degree from EUDIL, Lille (1993). Between 1996 and 2001, he worked in the Paris area at Thomson CSF LCR (now Thales TRT), Alcatel Alsthom Recherche, and the LCIE private research laboratories. From 2002 to early 2012, he managed a calibration laboratory specializing in phase noise and short-term frequency stability. Since 2001, he has been affiliated with the Centre National de la Recherche Scientifique (CNRS), a government-funded research organization under the authority of the French Ministry of Research, working at the FEMTO-ST Institute in Besançon. In 2010, one of his articles was highlighted in Electronics Letters for reporting, together with Czech and Swiss collaborators, the best frequency stability ever measured on a quartz crystal oscillator (2.5 × 10¹ at 5 MHz). From 2010 until recently, his research focused on optoelectronic resonators and oscillators for microwave photonics applications. He currently serves as the deputy head of the Phononics & Microscopy team in the Micro Nano Science & Systems Department (CNRS UMR 6174, FEMTO-ST), with an ongoing interest in uncertainty estimation. Dr. Salzenstein has contributed to more than 140 publications in peer-reviewed international journals and international conferences. He is Associate Editor for Open Physics and Metrology. He has more than 30 verified editor records and 100 verified peer reviews.
