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Marine TILLETTE DE CLERMONT TONNERRE

CORBEIL-ESSONES

En résumé

Mes compétences :
Informatique
Physique Quantique
Physique du solide
Physique des laser et des fibres optiques
Cristallographie
Physique du semi conducteur
Nanotechnologies
Microscopie electronique
Nanomagnétisme

Entreprises

  • X-FAB - Process Equipment Engineer

    2016 - maintenant Work in clean-room environment on different CMP (Chemical Mechanical Planarization) types of tools.
    Responsible for several CMP processes :
    - Production support
    - Crisis management, troubleshooting
    - Process improvement
    - Qualification of new processes
    - Enhancement of the Statistical Process Control (SPC) of the equipments
    - Collaboration with other sectors (deposition, etching, metrology, ...) and other services (Quality, Electrical testing, ...)
    - Technology transfer
  • ALTIS Semiconductor - Process Equipment Engineer

    2014 - 2016 Work in clean-room environment on different CMP (Chemical Mechanical Planarization) types of tools.
    Responsible for several CMP processes :
    - Production support
    - Crisis management, troubleshooting
    - Process improvement
    - Qualification of new processes
    - Enhancement of the Statistical Process Control (SPC) of the equipments
    - Collaboration with other sectors (deposition, etching, metrology, ...) and other services (Quality, Electrical testing, ...)
  • University of Cambridge - Intern

    2014 - 2014 Subject : Experimental study of spin orbit torques in materials with perpendicular magnetic anisotropy

    - Design and fabrication of samples
    - Conception of an experimental setup

    Publication : "Two-dimensional control of field-driven magnetic bubble movement using Dzyaloshinskii-Moriya interactions"
    Link : http://scitation.aip.org/content/aip/journal/apl/106/2/10.1063/1.4905600
  • Hacienda tranquila - Volunteer

    2013 - 2013
  • LETI - 10 months internship in metrology and defectivity

    2012 - 2013 - Work in clean-room environment on un-patterned 200/300mm defectivity tools
    - Production support : recipe creation, BKM (Best Known Method) definition, users training, SPC
    (Statistical Process Control) refinement, procedure writing, troubleshooting
    - Application development for the thickness measurement on SOI wafers using the haze analysis
  • STMicroelectronics - Industrial internship in metrology

    2012 - 2012 - Assessment of tools capability, matching and setup optimization for sheet resistance
    measurement
    - Comparison of two technics for the permittivity measurement on low K materials
  • Rêveries Sucrées - Labor internship

    2011 - 2011 Teamwork in the elaboration of products, conditioning and the preparation for the deliveries.

Formations

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