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LAAS-CNRS
- Research Engineer
2010 - maintenant
Impact of extended (EOR) implantation defects on the leakage current of MOS transistors (European project ATEMOX - Collaboration with ST Microelectronics)
- Fabrication of reference components in clean room
- Electrical measurements (DLTS, I-V, C-V)
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LAAS-CNRS
- PhD Researcher
2006 - 2009
Ph.D. in optoelectronics:
"Towards CMOS comatible light sources: correlation between fabrication and properties of LPCVD Si nanocrystals"
- Dielectric thin film growth/deposition
- Thermal process development (RTA, conventional)
- Optical characterization (PL, Ellipsometry, FTIR, Raman)
- Electrical characterization (C-V, I-V)
- Optical test bench set up and calibration
- Low temperature measurements
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LAAS-CNRS
- Internship
2005 - 2005
"Fabrication and optical characterization of Si nanocrystals"
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LAAS-CNRS
- Internship (ERASMUS)
2004 - 2004
"Nanocrystallization of Si-rich oxides"
