Palaiseau
After I graduated his Master of Science at University of Montpellier in 2007 about the reliability of electronics devices against radiation (in space and avionic environment) and I did an internship at Vanderbilt University, Nashville TN, with the professor R. D. Schrimpf.
Next, I worked at NXP Semiconductor IMEC, Belgium. During this work experience, I was focus on the study of the variability by matched pair measurements and on TCAD simulations (Synopsys) for very large scaling integration SOI FinFET with sub-10nm fin width. In fall 2008, I started my PhD program in Toulouse at ONERA about the prediction of Single Event Effects (SEE) in electronics devices dedicated for space application. This work was supported by the CNES (French Space Agency). I've graduated my PhD in fall 2011 in Toulouse. This work with the atomic energy center (CEA in French) about the SEE prediction on SOI transistor and SRAMs beyond 32nm has been awarded at the RADECS conference in 2011. Moreover I received the award of the best 2011 ONERA PhD in physics thematic.
Since 2012, I am is a Microelectronics Radiation Effects Researcher at ONERA for the Space Environment Department (DESP in French) for a full-time job. I've developed strong skills in device physics and CMOS process technologies, using combined TCAD and circuit simulators. I continue to do important works related to predicting and modeling single event effects in advanced electronics and systems. These works have been published in the IEEE Transactions on Nuclear Science, ELSEVIER Acta Astronautica, and ELSEVIER microelectronics reliability since 2010.
In 2014, I started to supervise a PhD student, Ahmad Al Youssef who worked on SEE modeling and especially on Single Event Latchup modeling in readout circuit. He graduated in fall 2017.
Since 2016, I also supervise an other PhD student, Pablo Caron who works on the modeling of SEU induced by high energy electrons.
Mes compétences :
Gestion de projet
Simulation numérique
TCAD
Caractérisation électrique
Qualité
Programmation informatique
Encadrement
Modélisation
